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Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy

机译：使用X射线衍射和压电响应力显微镜研究外延pbxsr1-xTiO3薄膜中的铁电畴

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S. Fernandez-Peña; C. Lichtensteiger; P. Zubko; C. Weymann; S. Gariglio; J.-M. Triscone;
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1. Ferroelectric domains in epitaxial PbxSr1?xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy [J] . S. Fernandez-Pe?a, C. Lichtensteiger, P. Zubko, APL Materials . 2016,第8期

机译：利用X射线衍射和压电响应力显微镜研究外延PbxSr1？xTiO3薄膜中的铁电畴
2. Ferroelectric domains in epitaxial PbTiO_3 films on LaAIO_3 substrate investigated by piezoresponse force microscopy and far-infrared reflectance [J] . E. Simon, F. Borodavka, I. Gregora, Journal of Applied Physics . 2011,第8期

机译：LaAIO_3衬底上外延PbTiO_3薄膜中的铁电畴的压电响应力显微镜和远红外反射率研究
3. Low-temperature dynamics of ferroelectric domains in PbZr_(0.3)Ti_(0.7)O_3 epitaxial thin films studied by piezoresponse force microscopy [J] . N. V. Andreeva, A. F. Vakulenko, A. Petraru, Applied Physics Letters . 2015,第15期

机译：压电响应力显微镜研究PbZr_（0.3）Ti_（0.7）O_3外延薄膜中铁电畴的低温动力学
4. Investigation of Domain Wall Velocity and Nucleation Rate in Polarization Switching of Epitaxial Pb(Zr,Ti)O_3 Thin Films Using Piezoresponse Scanning Force Microscopy [C] . H. Fujisawa, T. Yagi, M. Shimizu, Materials Research Society Symposium . 2003

机译：用压电响应扫描力显微镜检查外延PB（Zr，Ti）O_3薄膜偏振切换域壁速度和成核速率
5. Nanoscale studies of switching behavior of ferroelectric thin films by using piezoresponse force microscopy. [D] . Wu, Dong. 2009

机译：利用压电响应力显微镜对铁电薄膜的开关行为进行纳米研究。
6. Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction [O] . Dominik Kriegner, Petr Harcuba, Jozef Veselý, -1

机译：通过扫描X射线纳米束显微镜和电子背散射衍射在拓扑绝缘体Bi2Te3和Bi2Se3外延薄膜中进行双畴成像
7. Erratum to: Photoinduced effects of ferroelectric domains in PbZr1x Ti x O3 thin films as obtained by using piezoresponse force microscopy [O] . Y. H. Jang, C. H. Kim, H. J. Hwang, 2013

机译：错误的：通过使用压电响应力显微镜获得的PBZR1X Ti X O3薄膜的铁电域的光诱导效果
8. Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy [R] . Aggarwal, S. , Auciello, O. , Gruverman, A. , 1998

机译：用扫描力显微镜研究铁电薄膜偏振保持损耗的纳米尺度

Ferroelectric domains in epitaxial PbxSr1−xTiO3 thin films investigated using X-ray diffraction and piezoresponse force microscopy

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